NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

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Ta

Ta

tantalum

CAS Registry No:

7440-25-7

element

Author Name(s):

Riffe D.M., Wertheim G.K.

Phys. Rev. B 47, 6672

Pub Year:

1993

book All Records in this Publication

Surface Core-level Shift for the Second Layer of Atoms

Line Designation:

SS1-4f_7/2

Surface Core-Level Shift (eV) for the first Layer of Atoms:

0.36

Energy Uncertainty:

0.012

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

0.110

Lorentzian Width (eV):

0.052

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

70, 100

Overall Energy Resolution (eV):

0.08

Calibration:

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

Ta(110). The FWHM of the bulk component was 0.088+-0.020 eV. Peak locations: Doniach - Sunjic & Gaussian. Singularity index = 0.133+-0.012. The spectra were recorded at normal emission.

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