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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
C
Formula:
(CH
3
(CH
2
)
16
C(O)O)
2
Cd/Si
XPS Formula:
alkyl carbon
Name:
cadmium stearate/silicon
CAS Registry No:
2223-93-0
Class:
organic acid
Author Name(s):
Marshbanks T.L., Jugduth H.K., Delgass W.N., Franses E.I.
Journal:
Thin Solid Films 232, 126
DOI:
10.1016/0040-6090(93)90774-J
Pub Year:
1993
book
All Records in this Publication
Data Type:
Photoelectron Line
Line Designation:
1s
Binding Energy (eV):
285.80
Energy Uncertainty:
0.2
Background Subtraction Method:
other
Peak Location Method:
Gaussian
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au,Ag,Cu = 84.00,368.27,932.67
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
Langmuir-Blodgett film. Emission angle = 60 degrees.
Specimen:
cooled, reacted film, thin film
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
77
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