NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

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S

HS(CH₂)₁₁B(OH)₂/Au

11-borono-undecane-1-thiol/gold

CAS Registry No:

thiol

Author Name(s):

Carey R.I., Folkers J.P., Whitesides G.M.

Langmuir 10, 2228

Pub Year:

1994

book All Records in this Publication

Doublet Separation for Photoelectron Lines

Line Designation:

DS-2p

Double Separation (eV):

1.20

Energy Uncertainty:

Background Subtraction Method:

Shirley

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

Yes

Anode Material:

Al

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au4f7 = 84.00

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

1ML (or 17 A) HS(CH)11B(OH)2/Au. Self-assembled monolayer. The film thickness was measured by XPS. Branching ratio = 0.5. The intensity ratio of the Gaussian/Lorentzian components was 80/20.

surface coverage from 1ML to 2ML (1ML <= coverage < 2ML), thin layer

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300

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