NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

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S

CH₃SH/Ru

atomic sulfur

methanethiol/ruthenium

CAS Registry No:

74-93-1

element, thiol

Author Name(s):

Mullins D.R., Lyman P.F.

J. Phys. Chem. 97, 12008

Pub Year:

1993

book All Records in this Publication

Photoelectron Line

Line Designation:

2p_3/2

Binding Energy (eV):

161.50

Energy Uncertainty:

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

208

Overall Energy Resolution (eV):

Calibration:

FL = Fermi level

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

0.22 ML CH3SH was desorbed onto single crystalline Ru(0001) at 100 K and annealed at 150 K and 200 K. The substrate was cleaned by Ar+ ion bombardment and annealing (T = 1500 K).

adsorbed, annealed, cooled, surface coverage from 0ML to 1ML (0ML < coverage < 1ML), thin layer

Method of Determining Specimen Composition:

Auger Electron Spectroscopy

Method of Determining Specimen Crystallinity:

X-ray Diffraction

Specimen Temperature (K):

150, 200

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