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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
O
Formula:
TiO
2
Name:
titanium(IV) dioxide
CAS Registry No:
13463-67-7
Class:
catalyst, IV-VI semiconductor, mineral, oxide
Author Name(s):
Aas N., Pringle T.J., Bowker M.
Journal:
J. Chem. Soc. Faraday Trans. 90, 1015
DOI:
10.1039/FT9949001015
Pub Year:
1994
book
All Records in this Publication
Data Type:
Photoelectron Line
Line Designation:
1s
Binding Energy (eV):
529.70
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
2.1
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Adventitious carbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
The composition determined by XPS was TiO1.7. The sample was annealed at 773 K in vacuum. Emission angle = 45 degrees.
Specimen:
insulator, pelletized
Method of Determining Specimen Composition:
X-ray Photoelectron Spectroscopy
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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