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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
Mg
Formula:
MgTe
Name:
magnesium telluride
CAS Registry No:
Class:
chalcogenide, II-VI semiconductor, telluride
Author Name(s):
Wang M.W., Swenberg J.F., Phillips M.C., Yu E.T., McCaldin J.O., Grant R.W., et al.
Journal:
Appl. Phys. Lett. 64, 3455
DOI:
10.1063/1.111239
Pub Year:
1994
book
All Records in this Publication
Data Type:
Photoelectron Line
Line Designation:
2s
Binding Energy (eV):
88.16
Energy Uncertainty:
0.05
Background Subtraction Method:
other
Peak Location Method:
mixed Gaussian/Lorentzian
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
Yes
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Valence band minimum
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
Peak locations: Voigt function.
Specimen:
crystal, molecular beam epitaxy, semiconductor
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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