NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

One Page Summary

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Element:

SHCH₂CH(NH₂)COOH/Au

SHCH₂CH(NH₂)C*OOH/Au

L - cysteine/gold

52-90-4

amino acid/its derivatives, organic acid, thiol

Author Name(s):

Uvdal K., Bodo P., Liedberg B.

Journal:

J. Colloid Interface Sci. 149, 162

DOI:

Pub Year:

1992

book All Records in this Publication

Photoelectron Line

288.70

0.2

Background Subtraction Method:

other

Peak Location Method:

other type of curve fit

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Ag,Cu = 368.27,932.67

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable, with two-point correction of energy scale

Comment:

The composition determined by XPS was C2.29NS0.77O1.85. The relative intensity was 0.26. The film thickness measured by XPS was 40 A.

Specimen:

cooled, multilayer, thin layer, vapor deposited

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

223