NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

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S

SHCH₂CH(NH₂)COOH/Cu

sulfur atoms in chemisorbed species

L - cysteine/copper

CAS Registry No:

52-90-4

amino acid/its derivatives, organic acid, thiol

Author Name(s):

Uvdal K., Bodo P., Liedberg B.

J. Colloid Interface Sci. 149, 162

Pub Year:

1992

book All Records in this Publication

Photoelectron Line

Line Designation:

2p_3/2

Binding Energy (eV):

162.50

Energy Uncertainty:

0.2

Background Subtraction Method:

other

Peak Location Method:

other type of curve fit

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

No

Anode Material:

Mg

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Ag,Cu = 368.27,932.67

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable, with two-point correction of energy scale

Comment:

The composition determined by XPS was C2.68NS0.99O1.96. The relative intensity was 0.25. Emission angle = 80 degrees. The adsorbate thickness measured by XPS was about 14 A.

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