NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

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W

WSe₂

tungsten diselenide

CAS Registry No:

12067-46-8

chalcogenide, II-VI semiconductor, IV-VI semiconductor, selenide

Author Name(s):

Lang O., Tomm Y., Schlaf R., Pettenkofer C., Jaegermann W.

J. Appl. Phys. 75, 7814

Pub Year:

1994

book All Records in this Publication

Photoelectron Line

Line Designation:

4f_7/2

Binding Energy (eV):

31.65

Energy Uncertainty:

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

No

Anode Material:

Mg

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au,Cu = 84.00,932.67

Charge Reference:

Valence band minimum

Energy Scale Evaluation:

Reliable, with two-point correction of energy scale

Comment:

The n-type Br-doped WSe2(0001) single crystal with a carrier concentration of 2E16 cm-3 was prepared by standard gas transport. The spectra were recorded at normal emission.

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