NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

One Page Summary

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Element:

Eu/W

europium/tungsten

7440-53-1

element

Kaindl G., Hohr A., Weschke E., Vandre S., Schussler-Langeheine C., et al.

Journal:

Phys. Rev. B 51, 7920

DOI:

Pub Year:

1995

book All Records in this Publication

Data Type:

Surface Core-level Shift

Line Designation:

SS-4f_7/2

Surface Core-Level Shift (eV):

-0.48

Energy Uncertainty:

0.030

Background Subtraction Method:

other

Peak Location Method:

other type of curve fit

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

40.8

Overall Energy Resolution (eV):

0.03

Calibration:

FL = Fermi level

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

~ 100 A Eu(0001)/W(110). The thickness was measured using a quartz-crystal thickness monitor. FAT mode.

Specimen:

cooled, crystal, molecular beam epitaxy, thin film

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):