NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 21

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

C₅H₅N/MoS₂

286.20

C₅H₅N/O/MoS₂

285.80

O₂/MoS₂

285.80

MoS₂

3d_3/2

232.30

MoS₂

3d_5/2

229.20

C₅H₅N/O/MoS₂

399.90

NO/MoS₂

401.80

NO/MoS₂

403.50

C₅H₅N/MoS₂

400.30

O₂/MoS₂

399.90

NO/MoS₂

401.80

NO/MoS₂

403.50

NO/MoS₂

532.50

NO/MoS₂

532.50

NO/MoS₂

530.50

O₂/MoS₂

533.40

H₂O/MoS₂

533.90

O₂/C₅H₅N/MoS₂

533.50

O₂/MoS₂

533.50

NO/MoS₂

532.50

MoS₂

2p_3/2

162.20

Photoelectron Line

400.30

0.1

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

C5H5N/MoS2. Saturation coverage. Composition of the substrate determined by XPS is MoS2.2, polycrystalline