NIST X-ray Photoelectron Spectroscopy Database

Alexander M. R., Short R. D., Jones F. R., Stollenwerk M., Zabold J., and Michaeli, W., J. Mat. Sci. 31, 1879 (1996)DOI:

Instruction:

Click the column to sort in ascending or descending order.
Enter a string in the input box in the column header and press the enter to filter the search result in the selected column.
Click on the hyperlink in the column for more information.

Total Records: 6

Element	Atomic No	Formula	Spectral Line	Energy (eV)

O	8	(^-Si(CH₃)₂O^-)n	1s	532.80
Si	14	(^-Si(CH₃)₂O^-)n	2p	102.50
O	8	(Si(CH₃)(C₆H₅)^-O^-)n	1s	532.50
Si	14	(Si(CH₃)(C₆H₅)^-O^-)n	2p	102.10
O	8	SiO₂	1s	532.40
Si	14	SiO₂	2p	103.20