NIST X-ray Photoelectron Spectroscopy Database

Behner H., Wecker J., Matthee T., Samwer K., Surf. Interface Anal. 18, 685 (1992)DOI:

Instruction:

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Total Records: 19

Element	Atomic No	Formula	Spectral Line	Energy (eV)

Si	14	SiO₂/Si	2p	103.40
Si	14	SiO₂/Si	2s	154.40
Y	39	Y₂O₃/SiO₂/Si	3d_5/2	158.00
Y	39	Y₂O₃/SiO₂/Si	3d_3/2	159.80
Si	14	Y₂O₃/SiO₂/Si	2p	102.40
Si	14	Y₂O₃/SiO₂/Si	2p	99.40
Si	14	Y/SiO₂/Si	2p	99.40
Si	14	(ZrO₂)₉₁(Y₂O₃)₉/Si	2p	99.40
Si	14	(ZrO₂)₉₁(Y₂O₃)₉/Si	2p	99.40
Zr	40	(ZrO₂)₉₁(Y₂O₃)₉/Si	3d_5/2	179.00
Zr	40	(ZrO₂)₉₁(Y₂O₃)₉/Si	3d_3/2	181.40
Zr	40	(ZrO₂)₉₁(Y₂O₃)₉/Si	3d_5/2	182.90
Zr	40	(ZrO₂)₉₁(Y₂O₃)₉/Si	3d_3/2	185.30
Zr	40	(ZrO₂)₉₁(Y₂O₃)₉/Si	3d_5/2	179.00
Zr	40	(ZrO₂)₉₁(Y₂O₃)₉/Si	3d_3/2	181.40
Zr	40	(ZrO₂)₉₁(Y₂O₃)₉/Si	3d_5/2	183.20
Zr	40	(ZrO₂)₉₁(Y₂O₃)₉/Si	3d_3/2	185.50
Si	14	Si/SiO₂	2s	151.00
Si	14	Si/SiO₂	2p	99.40