NIST X-ray Photoelectron Spectroscopy Database

Craciun V., Reader A.H., Vandenhoudt D.E.W., Best S.P., Hutton R.S., Andrei A., et al., Thin Solid Films 255, 290 (1995)DOI:

Instruction:

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Enter a string in the input box in the column header and press the enter to filter the search result in the selected column.
Click on the hyperlink in the column for more information.

Total Records: 5

Element	Atomic No	Formula	Spectral Line	Energy (eV)

O	8	O₂/Si	1s	532.90
Si	14	O₂/Si₀.₈Ge₀.₂/Si	2p	103.40
O	8	O₂/Si₀.₈Ge₀.₂/Si	1s	532.90
Si	14	Si/O₂	2p	99.00
Si	14	Si/O₂	2p	103.40