NIST X-ray Photoelectron Spectroscopy Database

Cros A., Saoudi R., Hewett C.A., Lau S.S., Hollinger G., J. Appl. Phys. 67, 1826 (1990)DOI:

Instruction:

Click the column to sort in ascending or descending order.
Enter a string in the input box in the column header and press the enter to filter the search result in the selected column.
Click on the hyperlink in the column for more information.

Total Records: 13

Element	Atomic No	Formula	Spectral Line	Energy (eV)

Si	14	SiOx/Si	2p	103.60
O	8	SiOx/Si	1s	532.80
Au	79	Au₈₁Si₁₉	4f_7/2	83.90
Si	14	SiO₂/Si	2p	103.50
O	8	SiO₂/Si	1s	532.80
Si	14	Au₃₄Si₆₆	2p	98.80
Au	79	Au₃₄Si₆₆	4f_7/2	84.30
Si	14	Au₄₅Si₅₅	2p	99.10
Au	79	Au₄₅Si₅₅	4f_7/2	84.50
Si	14	Au₅₉Si₄₁	2p	98.90
Au	79	Au₅₉Si₄₁	4f_7/2	84.00
Si	14	SiOx/Si	2p	99.10
Si	14	SiOx/Si	2p	99.50