NIST X-ray Photoelectron Spectroscopy Database

Finster J., Klinkenberg E.-D., Heeg J., Vacuum 41, 1586 (1990)DOI:

Instruction:

Click the column to sort in ascending or descending order.
Enter a string in the input box in the column header and press the enter to filter the search result in the selected column.
Click on the hyperlink in the column for more information.

Total Records: 22

Element	Atomic No	Formula	Spectral Line	Energy (eV)

Si	14	Si	2p	99.20
Si	14	Si₂N₂O	2p	101.70
O	8	Si₂N₂O	1s	531.90
N	7	Si₂N₂O	1s	397.40
Si	14	SiO₂	2p	103.60
O	8	SiO₂	1s	533.20
Si	14	SiO₂	2p	103.00
O	8	SiO₂	1s	533.00
Si	14	Si₃N₄/Si	2p	102.00
N	7	Si₃N₄/Si	1s	397.90
Si	14	Si₃N₄/InP	2p	101.90
N	7	Si₃N₄/InP	1s	397.80
Si	14	Si₃N₄/Si	2p	101.90
N	7	Si₃N₄/Si	1s	397.80
Si	14	SiO₀.₃₅N₁.₁/Si	2p	102.10
O	8	SiO₀.₃₅N₁.₁/Si	1s	532.30
N	7	SiO₀.₃₅N₁.₁/Si	1s	397.70
O	8	SiO₂/Si	1s	532.80
Si	14	SiO₂/Si	2p	103.70
Si	14	SiO₀.₇N₀.₉/Si	2p	102.20
O	8	SiO₀.₇N₀.₉/Si	1s	532.10
N	7	SiO₀.₇N₀.₉/Si	1s	397.60