NIST X-ray Photoelectron Spectroscopy Database

Kerkhof F.P.J., Moulijn J.A., Heeres A., J. Electron Spectrosc. Relat. Phenom. 14, 453 (1978)DOI:

Instruction:

Click the column to sort in ascending or descending order.
Enter a string in the input box in the column header and press the enter to filter the search result in the selected column.
Click on the hyperlink in the column for more information.

Total Records: 4

Element	Atomic No	Formula	Spectral Line	Energy (eV)

Si	14	SiO₂,quartz	2p_3/2	103.90
O	8	SiO₂,quartz	1s	533.00
O	8	WO₃	1s	530.80
W	74	WO₃	4f_7/2	35.80