NIST X-ray Photoelectron Spectroscopy Database

Kohiki S., Nishitani M., Negami T., Wada T., Phys. Rev. B 45, 9163 (1992)DOI:

Instruction:

Click the column to sort in ascending or descending order.
Enter a string in the input box in the column header and press the enter to filter the search result in the selected column.
Click on the hyperlink in the column for more information.

Total Records: 12

Element	Atomic No	Formula	Spectral Line	Energy (eV)

Se	34	Cu₂₉.₁In₂₂.₄Se₄₈.₅/SiO₂	L₃MM	1307.30
Se	34	Cu₂₅.₆In₂₄.₄Se₅₀/SiO₂	L₃MM	1307.30
Se	34	Cu₂₄.₃In₂₅.₈Se₄₉.₉/SiO₂	L₃MM	1307.30
Se	34	Cu₂₃.₄In₂₆.₅Se₅₀.₁/SiO₂	L₃MM	1307.30
In	49	Cu₂₃.₄In₂₆.₅Se₅₀.₁/SiO₂	3d_5/2	446.60
Se	34	Cu₂₃.₄In₂₆.₅Se₅₀.₁/SiO₂	3d	54.30
In	49	Cu₂₄.₃In₂₅.₈Se₄₉.₉/SiO₂	3d_5/2	444.60
Se	34	Cu₂₄.₃In₂₅.₈Se₄₉.₉/SiO₂	3d	54.40
In	49	Cu₂₅.₆In₂₄.₄Se₅₀/SiO₂	3d_5/2	444.80
Se	34	Cu₂₅.₆In₂₄.₄Se₅₀/SiO₂	3d	54.50
In	49	Cu₂₉.₁In₂₂.₄Se₄₈.₅/SiO₂	3d_5/2	444.80
Se	34	Cu₂₉.₁In₂₂.₄Se₄₈.₅/SiO₂	3d	54.50