NIST X-ray Photoelectron Spectroscopy Database

Yamauchi T., Kitamura H., Wakai N., Zaima S., Koide Y., and Yasuda Y., J. Vac. Sci. Technol. A 11, 2619 (1993)DOI:

Instruction:

Click the column to sort in ascending or descending order.
Enter a string in the input box in the column header and press the enter to filter the search result in the selected column.
Click on the hyperlink in the column for more information.

Total Records: 18

Element	Atomic No	Formula	Spectral Line	Energy (eV)

Ti	22	TiSi₂	CS-2p_3/2	0.30
Zr	40	ZrSi₂	CS-3d_5/2	0.30
Hf	72	Hf₃Si₂	CS-4f_7/2	0.30
V	23	VSi₂	CS-2p_3/2	0.50
Si	14	SiO₂/Si	2p	103.20
Si	14	Si/SiO₂	2p	99.30
Zr	40	Zr/Ta	3d_5/2	178.80
Zr	40	Zr/Ta	3d_3/2	181.10
Zr	40	Zr/SiO₂/Si	3d_5/2	178.90
Zr	40	Zr/SiO₂/Si	3d_3/2	181.20
Si	14	Si/SiO₂/Zr	2p	99.10
Zr	40	Zr/SiO₂/Si	3d_5/2	179.00
Zr	40	Zr/SiO₂/Si	3d_3/2	182.20
Si	14	Si/SiO₂/Zr	2p	98.90
Zr	40	Zr/Si	3d_5/2	178.80
Si	14	Si/Zr	2p_3/2	99.30
Zr	40	Zr/Si	3d_5/2	179.10
Si	14	Si/Zr	2p_3/2	98.70