There was a problem with the connection!

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Pt
Formula:
Cu/Pt
XPS Formula:
bulk state
Name:
copper/platinum
CAS Registry No:
7440-50-8
Class:
alloy, element

Citation:
Author Name(s):
Barrett N.T., Belkhou R., Thiele J., Guillot C.
Journal:
Surf. Sci. 331, 776
DOI:
Pub Year:
1995

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
4f7/2
Binding Energy (eV)
70.97
Energy Uncertainty:
0.06
Background Subtraction Method:
Shirley
Peak Location Method:
mixed Gaussian/Lorentzian
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
0.32
Lorentzian Width (eV):
0.5

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
other source
X-ray Energy:
155
Overall Energy Resolution (eV):
0.32
Calibration:
FL = Fermi level
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
2.1 ML Cu/Pt(111) annealed at 573 K for 70 min. Peak locations: Doniach - Sunjic & Gaussian. Asymmetry parameter = 0.11.

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
An error has occurred. This application may no longer respond until reloaded. Reload 🗙