NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

copper

7440-50-8

element

Citation:

Author Name(s):

Mansour A.N.

Journal:

Surf. Sci. Spectra 3, 202

DOI:

Pub Year:

1994

bookAll Records in this Publication

Data Processing:

Auger-Electron Line

L₂VV

934.70

Background Subtraction Method:

Shirley

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Cu 3p3, 2p3 = 75.13, 932.67

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable, with two-point correction of energy scale

Comment:

Emission angle = 45 degrees. FAT mode. Analyzer pass energy = 35.75. Analyzer resolution = 0.54 eV. There are two peaks in the Cu L2VV Auger spectrum

Specimen:

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300