NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Rh

NO/Rh

nitrogen oxide/rhodium

CAS Registry No:

10102-43-9

element, non-stoichiometric oxide, oxide

Citation:

Author Name(s):

Zacchigna M., Astaldi C., Prince K.C., Sastry M., Comicioli C., Rosei R., et al.

Surf. Sci. 347, 53

Pub Year:

1996

book All Records in this Publication

Data Processing:

Interface Core-Level Shift

Line Designation:

INT-3d_5/2

Interface Core-Level Shift

1.04

Energy Uncertainty:

0.01

Background Subtraction Method:

Linear

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

0.18

Lorentzian Width (eV):

0.58

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

390

Overall Energy Resolution (eV):

0.15

Calibration:

FL = Fermi level

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

20 L CO/Rh(100). The sample was cleaned by cycles of Ar+ ion bombardment, annealing and oxidation-reduction cycles in O2. Peak locations: Doniach - Sunjic & Gaussian. Asymmetry parameter = 0.20. Lorentzian width of bulk state was 0.18 eV. FAT mode. Emission angles = 5 and 45 degrees.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

<210

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