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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
W
Formula:
H2/W
XPS Formula:
atoms of pinched surface molecules W2H
Name:
hydrogen/tungsten
CAS Registry No:
7440-33-7
Class:
element, hydride

Citation:
Author Name(s):
Jupille J., Purcell K.G., King D.A.
Journal:
Surf. Sci. 367, 149
DOI:
Pub Year:
1996

Data Processing:
Data Type:
Surface Core-level Shift for the Third Layer of Atoms
Line Designation:
SS3-4f7/2
Surface Core-Level Shift (eV) for the third Layer of Atoms
0.09
Energy Uncertainty:
0.03
Background Subtraction Method:
Linear
Peak Location Method:
mixed Gaussian/Lorentzian
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
0.220
Lorentzian Width (eV):
0.55

Measurement:
Use of X-ray Monochromator:
Yes
Anode Material:
other source
X-ray Energy:
75
Overall Energy Resolution (eV):
0.22
Calibration:
FL = Fermi level
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
H2/W(100)c(2x2). The coverages were 0.33, 0.44 and 0.55. The substrate was leaned by repeated heating to 1800 K in 1E-6 Torr O2 and flashing in vacuum to 2400 K. Peak locations: Doniach - Sunjic & Gaussian.

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Low-energy Electron Diffraction
Specimen Temperature (K):
300
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