NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

vanadium carbide

12070109

carbide

Citation:

Author Name(s):

Antonik M.D., Lad R.J., Christensen T.M.

Journal:

Surf. Interface Anal. 24, 681

DOI:

Pub Year:

1996

book All Records in this Publication

Data Processing:

Photoelectron Line

282.50

0.2

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Cu3p3, 2p3 = 75.11, 932.67

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable, with two-point correction of energy scale

Comment:

The sample was annealed (T = 1273 K, time= 30 min). FAT mode.

Specimen:

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction, Reflection High-Energy Electron Diffraction

Specimen Temperature (K):

300