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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
lead sulfide
chalcogenide, IV-VI semiconductor, mineral, sulfide

Citation:
Hernan L., Morales J., Sanches L., Tirado J.L., Espinos J.P., et al.
Chem. Mater. 7, 1576
Pub Year:
1995

Data Processing:
Photoelectron Line

Measurement:
Anode Material:
Mg/Al
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Adventitious carbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
FAT mode.

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
X-ray Diffraction
Specimen Temperature (K):
300

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