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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
C
Formula:
C70
Name:
C70 fullerene
CAS Registry No:
115383-22-7
Class:
element

Citation:
Author Name(s):
Han B., Yu L., Hevesi K., Gensterblum G., Rudolf P., Pireaux J.-J., et al.
Journal:
Phys. Rev. B 51, 7179
DOI:
Pub Year:
1995

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
1s, sat
Binding Energy (eV)
287.50
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
0.75
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
Yes
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
0.3
Calibration:
FL = Fermi level
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
~ 100 nm C70 were grown by thermal evaporation (T = ~723 K) on MoS2(0001) and GeS(001) cleaved in vacuum. The substrates were heated to ~ 423 K during deposition. The thickness was measured using a quartz-crystal thickness monitor.

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Low-energy Electron Diffraction
Specimen Temperature (K):
300
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