NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

Ga₂Se₃

Name:

digallium triselenide

CAS Registry No:

12024-24-7

Class:

chalcogenide, II-VI semiconductor, selenide

Citation:

Author Name(s):

Schmid D., Ruckh M., Schock H.W.

Journal:

Appl. Surf. Sci. 103, 409

DOI:

Pub Year:

1996

book All Records in this Publication

Data Processing:

Auger-Electron Line

L₃M₄₅M₄₅(¹G)

1065.00

0.2

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au,Cu = 84.00,932.67

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

Specimen:

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300