NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

nickel

7440-02-0

element

Citation:

Author Name(s):

Dube C.E., Workie B., Kounaves S.P., Robbat A., Jr, Aksu M.L., and Davies G.

Journal:

J. Electrochem. Soc. 142, 3357

DOI:

Pub Year:

1995

book All Records in this Publication

Data Processing:

Photoelectron Line

2p_3/2, sat

854.90

Background Subtraction Method:

Shirley

Peak Location Method:

other type of curve fit

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Cu2p3 = 932.67

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

FAT mode. Emission angle = 53.5 degrees.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300