There was a problem with the connection!

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
lead sulfide
chalcogenide, IV-VI semiconductor, mineral, sulfide

Citation:
Wittstock G., Kartio I., Hirsch D., Kunze S., Szargan R.
Langmuir 12, 5709
Pub Year:
1996

Data Processing:
Photoelectron Line
mixed Gaussian/Lorentzian

Measurement:
Anode Material:
other source
X-ray Energy:
240
Overall Energy Resolution (eV):
Calibration:
Au,Cu = 84.00,932.67
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
FAT mode. Branching ratio = 0.5. Mineral name is galena.

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300

An error has occurred. This application may no longer respond until reloaded. Reload 🗙