NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

[Pt₂(P(C₆H₅)₃)₄SSCH₃]I

XPS Formula:

[Pt₂(P(C₆H₅)₃)₄SS*CH₃]I

Name:

diplatinum tetrakis(triphenylphosphine) mu-sulfide mu-methylsulfide iodide

CAS Registry No:

Class:

organometallic, phenyl benzene, sulfur

Citation:

Author Name(s):

Aw B.H., Look K.K., Chan H.S.O., Tan K.L., Hor T.S.A.

Journal:

J. Chem. Soc. Dalton Trans. 3177

DOI:

Pub Year:

1994

book All Records in this Publication

Data Processing:

Photoelectron Line

2p_1/2

163.90

0.3

Background Subtraction Method:

other

Peak Location Method:

Gaussian

Full Width at Half-maximum Intensity (eV):

1.8

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au,Cu = 84.00,932.67

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

[Pt2(P(C6H5)3)4(mu-S)(mu-SCH3)]I. FRR mode. No radiation damage was detected.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300