NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

rhodium

7440-16-6

element

Citation:

Author Name(s):

Rothe J., Pollmann J., Franke R., Hormes J., Boennemann H., et al.

Journal:

Fres. J. Anal. Chem. 355, 372

DOI:

Pub Year:

1996

book All Records in this Publication

Data Processing:

Photoelectron Line

3d_5/2

307.20

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

Al/Mg

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au,Cu = 84.00,932.67

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

Peak locations: Voigt function.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300