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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
aluminum stibnide
25152-52-7
III-V semiconductor, stibnide

Citation:
Gualtieri G.J., Schwartz G.P., Nuzzo R.G., Sunder W.A.
Appl. Phys. Lett. 49, 1037
Pub Year:
1986

Data Processing:
Photoelectron Line

Measurement:
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au4f7 = 84.00
Charge Reference:
Valence band minimum
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
The sample was grown at a substrate temperature of 763 K

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300

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