NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

(^-C₆H₃(HS)^-)n

^-C₆H₄S*^-

poly(benzenethiol)

9016-75-5

phenyl benzene, polymer, sulfur, thiol

Citation:

Author Name(s):

Brauman S.K.

Journal:

J. Polym. Sci. Part A 27, 3285

DOI:

Pub Year:

1989

book All Records in this Publication

Data Processing:

Photoelectron Line

2p_3/2

163.60

0.1

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Biaxially oriented film (0.127 mm thick).

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300