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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
SiOx/Si
silicon oxides/silicon
11126-22-0
anhydride, element, IV-VI semiconductor, non-stoichiometric oxide, oxide

Citation:
Hollinger G.
Appl. Surf. Sci. 8, 318
Pub Year:
1981

Data Processing:
Photoelectron Line

Measurement:
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Gold
Energy Scale Evaluation:
Comment:

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):

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