NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

TiO₂

Ti*O₂

titanium(IV) dioxide

13463-67-7

catalyst, IV-VI semiconductor, mineral, oxide

Citation:

Author Name(s):

Bender H., Chen W., Portillo J., Van den Hove L., Wandervorst W.

Journal:

Appl. Surf. Sci. 38, 37

DOI:

Pub Year:

1989

book All Records in this Publication

Data Processing:

Photoelectron Line

458.30

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

A 150 nm thick Ti film was deposited on p-type Si(100) using DC magnetron sputtering.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300