NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

O₂/GaAs

XPS Formula:

Ga*Ox Elemental state

Name:

oxygen/gallium arsenide

CAS Registry No:

Class:

arsenic, arsenide, element, III-V semiconductor, IV-VI semiconductor, non-stoichiometric oxide, oxide

Citation:

Author Name(s):

Weber E.-H., Flamm D., Meisel A.

Journal:

J. Electron Spectrosc. Relat. Phenom. 47, 39

DOI:

Pub Year:

1988

book All Records in this Publication

Data Processing:

Chemical Shift

CS-3d

1.20

Background Subtraction Method:

other

Peak Location Method:

other type of curve fit

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

other anode

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Element

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

1.0E7 L O2/GaAs. Chemical shift is related to uncoordinated As

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300