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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
SiO2,quartz
silicon(IV) dioxide (Quartz)
60676-86-0
glass, IV semiconductor, IV-VI semiconductor, mineral, oxide, silicate

Citation:
Grunthaner F.J., Grunthaner P.J., Vasquez R.P., Lewis B.F., Maserjian J., Madhukar A.
J. Vac. Sci. Technol. 16, 1443
Pub Year:
1979

Data Processing:
Photoelectron Line

Measurement:
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au FL
Charge Reference:
Conductor
Energy Scale Evaluation:
Comment:

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):

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