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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
O
Formula:
(-C(O)C(CH3O)CHC(NO2)CHC-)CHCH(-CSCH(CH3)CH2C((CH3)2)N(CH3)-)
XPS Formula:
(-C(O)C(CH3O)CHC(NO*2)CHC-)CHCH(-CSCH(CH3)CH2C((CH3)2)N(CH3)-)
Name:
2-methoxy-4-nitro-6-((tetrahydro-3,4,4,6-tetramethyl-2H-1,3-thiazin-2-ylidene)ethylidene)-2,4-cyclohexadien-1-one
CAS Registry No:
85257336
Class:
amine, ketone, nitro(so), nitrogen, other ring, oxygen, sulfur

Citation:
Author Name(s):
Chehimi M.M., Delamar M.
Journal:
J. Electron Spectrosc. Relat. Phemon. 50, c25
DOI:
Pub Year:
1990

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
1s
Binding Energy (eV)
532.40
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Energy Scale Evaluation:
Comment:

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
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