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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
SiOx/Si
silicon oxides/silicon
11126-22-0
anhydride, element, IV-VI semiconductor, non-stoichiometric oxide, oxide

Citation:
Povey A.F., Ansell R.O., Dickinson T., Sherwood P.M.A.
J. Electroanal. Chem. 87, 189
Pub Year:
1978

Data Processing:
Photoelectron Line

Measurement:
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Adventitious carbon
Energy Scale Evaluation:
Reliable, with two-point correction of energy scale
Comment:

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):

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