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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
S
Formula:
(C6H4S4)2(C6H4S4)[Pt(S2C2O2)2]
XPS Formula:
(C6H4S4)2(C6H4S4)[Pt(S*2C2O2)2]
Name:
bis(tetrathiafulvalenium) tetrathiafulvalene bis(1,2-dithio-oxalato,S,S') platinate(II)
CAS Registry No:
Class:
organometallic, other ring, oxalate, oxygen, sulfur

Citation:
Author Name(s):
Bellitto C., Bonamico M., Fares V., Imperatori P., Patrizio S.
Journal:
J. Chem. Soc. Dalton Trans. 4, 719
DOI:
Pub Year:
1989

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
2p3/2
Binding Energy (eV)
162.30
Energy Uncertainty:
Background Subtraction Method:
other
Peak Location Method:
Gaussian
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au4f7 = 84.00
Charge Reference:
Internal hydrocarbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
X-ray Diffraction
Specimen Temperature (K):
300
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