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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Na
Formula:
NaF
XPS Formula:
Na*F
Name:
sodium fluoride
CAS Registry No:
7681-49-4
Class:
alkali, fluoride

Citation:
Author Name(s):
Kamada M., Aita O., Ichikawa K., Tsutsumi K.
Journal:
Phys. Rev. B 36, 4962
DOI:
Pub Year:
1987

Data Processing:
Data Type:
Auger-Electron Line
Line Designation:
L23VV
Kinetic Energy (eV)
20.20
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
Yes
Anode Material:
other source
X-ray Energy:
40
Overall Energy Resolution (eV):
0.4
Calibration:
Charge Reference:
Valence band minimum
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
The very thin samples were prepared in situ by evaporation onto gold substrates. The thickness of the samples was estimated to be about 100 A with an oscillating-quartz thickness gauge.

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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