NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

silver

7440-22-4

element

Citation:

Author Name(s):

Seah M.P., Smith G.C., Anthony M.T.

Journal:

Surf. Interface Anal. 15, 293

DOI:

Pub Year:

1990

bookAll Records in this Publication

Data Processing:

Auger-Electron Line

M₄N₄₅N₄₅

357.81

0.02

Background Subtraction Method:

Peak Location Method:

other type of curve fit

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

DVM

Charge Reference:

Conductor

Energy Scale Evaluation:

Calibration study

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300