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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
SiO1.8
SiO*1.8
silicon oxide (SiO1.8)
IV semiconductor, IV-VI semiconductor, non-stoichiometric oxide, oxide

Citation:
Pitts J.R., Thomas T.M., Czanderna A.W., Passler M.
Appl. Surf. Sci. 26, 107
Pub Year:
1986

Data Processing:
Photoelectron Line

Measurement:
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Adventitious carbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
Fused SiO2 was pumice scrubbed.

Specimen:
Method of Determining Specimen Composition:
X-ray Photoelectron Spectroscopy
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300

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