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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
indium phosphide
22398-80-7
II-VI semiconductor, III-V semiconductor, phosphide

Citation:
Huschka W., Ross D., Maier M., Umbach E.
J. Electron Spectrosc. Relat. Phemon. 46, 273,
Pub Year:
1988

Data Processing:
Photoelectron Line

Measurement:
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Ag,Cu,Au
Charge Reference:
Ag paste mount on met
Energy Scale Evaluation:
Comment:

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):

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