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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Ge
Formula:
(GeSe2)70(Tl2Se)30
XPS Formula:
(Ge*Se2)70(Tl2Se)30
Name:
germanium thallium selenide ((GeSe2)70(Tl2Se)30)
CAS Registry No:
Class:
chalcogenide, glass, IV-VI semiconductor, selenide

Citation:
Author Name(s):
Sanghera J.S., Heo J., Mackenzie J.D.
Journal:
J. Non-cryst. Solids 101, 8
DOI:
Pub Year:
1988

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
3d
Binding Energy (eV)
32.30
Energy Uncertainty:
Background Subtraction Method:
other
Peak Location Method:
Gaussian
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Other, C1s=284.44
Charge Reference:
Co-condensed hydrocarbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
Samples were ground into a powder to obtain a fresh surface at the ambient atmosphere and then spread onto an In foil. Graphite powder was intentionally added onto the surface of the powder to act as an internal reference.

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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