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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
CaF2/Si
Ca*F2/Si
calcium(II) difluoride/silicon
alkaline earth, fluoride

Citation:
Rieger D., Himpsel F.J., Karlsson U.O., McFeely F.R., Morar J.F., and Yarmoff J.A.
Phys. Rev. B 34, 7295
Pub Year:
1986

Data Processing:
Photoelectron Line

Measurement:
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Valence band minimum
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
Submonolayer coverage and 1.4 ML and 2.5 ML CaF2/Si(111)-(7x7), n-type P-doped with 5 Ohm cm resistivity. CaF2 was deposited at 923-973 K. The thickness was determined by XPS

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300

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