NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

TiN

Ti*N

titanium nitride

25583-20-4

nitride

Citation:

Author Name(s):

Biwer B.M., Bernasek S.L.

Journal:

J. Electron Spectrosc. Relat. Phemon. 40, 339

DOI:

Pub Year:

1986

book All Records in this Publication

Data Processing:

Photoelectron Line

2p_3/2

455.20

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au,Cu=84.00,932.67,Ti2p3=453.98

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300