There was a problem with the connection!

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
germanium
element, II-VI semiconductor, IV semiconductor, IV-VI semiconductor

Citation:
Satoh K., Takahashi T., Katayama-Yoshida H., Sagawa T.
J. Phys. Soc. Japan 54, 1214
Pub Year:
1985

Data Processing:
Photoelectron Line

Measurement:
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au
Charge Reference:
Gold
Energy Scale Evaluation:
Reliable
Comment:

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):

An error has occurred. This application may no longer respond until reloaded. Reload 🗙