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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
gallium phosphide
12063-98-8
chalcogenide, II-VI semiconductor, III-V semiconductor, phosphide

Citation:
Kohiki S., Ohmura T., Kusao K.
J. Electron Spectrosc. Relat. Phenom. 31, 85
Pub Year:
1983

Data Processing:
Photoelectron Line

Measurement:
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au
Charge Reference:
Ar=242.5
Energy Scale Evaluation:
Two-point correction of energy scale
Comment:

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):

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