NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

Sm/GaAs

Name:

samarium/gallium arsenide

CAS Registry No:

1303-00-0

Class:

arsenide, III-V semiconductor, IV-VI semiconductor

Citation:

Author Name(s):

Joyce J.J., Grioni M., del Giudice M., Ruckman M.W., Boscherini F., and Weaver J.H.

Journal:

J. Vac. Sci. Technol. A 5, 2019

DOI:

Pub Year:

1987

book All Records in this Publication

Data Processing:

Data Type:

Interface Core-Level Shift

Line Designation:

INT-3d

Interface Core-Level Shift

-1.75

Energy Uncertainty:

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

2-40 A Sm/GaAs. The energy is referenced to the bulk state of the Ga3d line.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300